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J. Choi, &. Kim, &. Kim, &. Park, &. Lee, &. Jo, &. D. Kim.  Characterization of MgZnO films depending on the deposition power of RF sputtering system.  New Phys.: Sae Mulli 69, 369 (2019).  https://doi.org/10.3938/NPSM.69.369
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