1 Department of Physics, Jeju National University, Jeju 63243, Korea
2 Kanghae Precision System, Hawsung 18487, Korea
Correspondence to: firstname.lastname@example.org
Received September 8, 2016; Revised October 6, 2016; Accepted October 6, 2016.
This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/3.0/) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
In this study, we used Hilbert phase microscopy to obtain quantitative, high spatial resolution phase images of sample objects with a large depth of field (DOF) based on interferometric methods. The Hilbert microscope is suitable for investigating fast-occurring phenomena because it requires only one image. The pitch of the interference pattern can be controlled by changing the angle between the two interference beams, and the DOF can be controlled by varying the overlapping width of the beam. The Hilbert transform was used to retrieve the phase of the sample in computer simulations, as well as in experiments, that measure the phase by using the fringe method.
PACS numbers: 42.25.Hz, 42.30.Rx, 42.30.Wb
Keywords: Depth of field, Fringe projection profiler, Hilbert microscopy