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Spatial Shift Estimate in Deflectometry for Profile Measurements
New Phys.: Sae Mulli 2017; 67: 1541~1545
Published online December 29, 2017;
© 2017 New Physics: Sae Mulli.

Silin NA, Doocheol KIM*

Department of Physics, Jeju National University, Jeju 63243, Korea
Correspondence to:
Received September 8, 2017; Revised October 3, 2017; Accepted October 3, 2017.
cc This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License ( which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
This paper presents a technique using transmission deflectometry to measure the three-dimensional (3-D) shapes of specular surfaces. The spatial shift estimate (SSE) model for determining the 3-D profile information of specular objects is investigated. Phase-measuring deflectometry is a useful and simple technique for 3-D measurements of specular objects. The shift estimate of the distorted patterns on the object are obtained by using the inverse function-based shift estimate (IFSE); the 3-D profile of the object is calculated from the degree of the shift. The method proposed is simpler and more flexible than traditional methods. Finally, we experimentally demonstrated the system with optical component.
PACS numbers: 42.30.Rx, 42.30.Wb, 42.30.Lr
Keywords: Phase-measuring deflectometry, Spatial shift estimate, Surface shape measurement

April 2018, 68 (4)
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