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The origin of New Physics: Sae Mulli (NPSM, ISO abbreviation: New Phys.: Sae Mulli.): Sae Mulli (새물리 in Korean characters means ‘new physics’) is the oldest Korean pure scientific journal. It was first published in 1961 just after the Korean War by the Korean Physical Society (KPS). The primary mission of Sae Mulli was to start building up Korean physics research community from almost nothing and in fact Sae Mulli had made tremendous contributions to the Korean science community. Through a peer-review system, Sae Mulli had continued elevating the level of scientific researches, consequently becoming a cornerstone of the economic miracle of Korea...

Editor-in-Chief : Sunglae CHO
New Physics: Sae Mulli Editorial Board

  • pISSN : 0374-4914
  • eISSN : 2289-0041
Research Papers
Study on the Correlation of Microstructure with Deposition Temperature of Thin Silicon Films by Using Spectroscopic Ellipsometry and Hydrogen Effusion
Ka-Hyun KIM*
Department of Physics, Chungbuk National University, Cheongju 28644, Korea
We analysed the material properties of thin-film silicon materials by using spectroscopic ellipsometry and hydrogen effusion. Hydrogenated amorphous silicon and the related thin film silicon material showed material properties significantly different from those of crystalline silicon, such as a wider band gap of about 1.7 eV, instead of the 1.1 eV in crystalline silicon, an elevated absorption coefficient, and characteristics of a direct bandgap. From a material point of view, an ellipsometry measurement is an indirect measurement because the result is usually given by a change in the polarization state of the probe light, so the ellipsometry measurement result must be transformed into meaningful parameters by modeling the measurement result. We used Tauc-Lorentz dispersion to model the ellipsometry measurement of the thin silicon film. In this paper, we discuss the modeling of spectroscopic ellipsometry data from thin-film silicon materials and the verification of the modeling result by using data from a complementary hydrogen effusion experiment.
New Phys.: Sae Mulli 2019; 69: 584-589
Wide-Range Light Emission of Silicon Oxide Nanowires Grown Using Zinc as a Catalyst
Jong-Hwan YOON*
산화 실리콘 나노와이어, 산화 아연. 실리콘 나노결정, 광역 발광
We report the wide-range light emission from silicon-oxide (SiO$_x$) nanowires formed by using Zn as a catalyst. The SiO$_x$ nanowires were formed by exposing Zn film formed on a Si substrate to a plasma of silicon and oxygen at a low temperature of about 380$^\circ$C, and then the nanowires were annealed at a high temperature of 1100$^\circ$C. The resultant SiO$_x$ nanowires exhibited a photoluminescence spectrum with a wavelength range of about 350 to 900 nm. This was understood to result from the inclusion of ZnO and Si nanocrystals in the SiO$_x$ nanowires.
New Phys.: Sae Mulli 2019; 69: 468-472
New Phys.: Sae Mulli 2019; 69: 458~589
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Research Papers
Electron-Beam-Assisted Low-Temperature Crystallization of CuInSe$_\text{2}$
Maeng Jun KIM, Sung Youp LEE, Hyeong Rag LEE, Sang Ho SOHN*
New Phys.: Sae Mulli 2019; 69: 458-461  https://doi.org/10.3938/NPSM.69.458
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Magnetic Properties of a PbWO$_4$:Ce$^{3+}$ Single Crystal Doped with Ce$^{3+}$ ion
Tae Ho YEOM*
New Phys.: Sae Mulli 2019; 69: 462-467  https://doi.org/10.3938/NPSM.69.462
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Wide-Range Light Emission of Silicon Oxide Nanowires Grown Using Zinc as a Catalyst
Jong-Hwan YOON*
New Phys.: Sae Mulli 2019; 69: 468-472  https://doi.org/10.3938/NPSM.69.468
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Analysis of the Appropriateness of Scientific Key Competencies Included in the Inquiry-Based Physics Activities of Middle School Science Textbooks Based on the 2015 Revised National Curriculum
You KIM, Munho KWON, Ho-Meoyng CHOI*
New Phys.: Sae Mulli 2019; 69: 473-483  https://doi.org/10.3938/NPSM.69.473
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Analysis of Student Questions in MOOC Physics Lectures: The Case of the Khan Academy
Sohee JEONG, Jinwoong SONG, Wonyong PARK
New Phys.: Sae Mulli 2019; 69: 484-496  https://doi.org/10.3938/NPSM.69.484
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Understanding the Behavioral Characteristics of Scientifically Gifted Elementary School Students based on the Characteristics of Creative Physicists’ Behavior During the Growth Period
Insun LEE, Jongwon PARK
New Phys.: Sae Mulli 2019; 69: 497-507  https://doi.org/10.3938/NPSM.69.497
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Implementation of Model-Based Inquiry Utilizing Lego Blocks: A Case Study of Fidget Spinner
Yong Wook CHEONG*
New Phys.: Sae Mulli 2019; 69: 508-518  https://doi.org/10.3938/NPSM.69.508
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Analysis of Scientific Literacy for the Achievement Standards in the 2015 Revised Physics Curriculum
Insun LEE, Jongwon PARK*
New Phys.: Sae Mulli 2019; 69: 519-531  https://doi.org/10.3938/NPSM.69.519
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Case Study on the Development of Teaching Materials for Programming-Based Physics Learning with a Focus on the Evaluation of Teaching Materials Developed by Pre-service Teachers and by using Perception Analysis of Development Experience
Jun Haeng LEE, Youngrae JI*, Seung Chul CHAE
New Phys.: Sae Mulli 2019; 69: 532-546  https://doi.org/10.3938/NPSM.69.532
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College Students’ Understanding of the Measurement Skill and Error in Reports on a Small Mass Experiment
Youngrae JI, Hunkoog JHO*
New Phys.: Sae Mulli 2019; 69: 547-558  https://doi.org/10.3938/NPSM.69.547
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Development of a Low-Cost Spectrophotometer Using Arduino for Educational Utilization
Gyeongmo MIN, Junehee YOO, Hyunjoo MOON
New Phys.: Sae Mulli 2019; 69: 559-567  https://doi.org/10.3938/NPSM.69.559
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Influence of the Energy Density in SrTiO$_3$ Homoepitaxial Thin Films Fabricated on SrTiO$_3$ (001) Substrates by using Pulsed Laser Deposition
Hien-Hoang VAN, Heon-Jung KIM*
New Phys.: Sae Mulli 2019; 69: 568-572  https://doi.org/10.3938/NPSM.69.568
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Effects of the Temperature of the Universe on Black-Hole Evaporations
Won Sik L'Yi*
New Phys.: Sae Mulli 2019; 69: 573-577  https://doi.org/10.3938/NPSM.69.573
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Use of a 3D Impedance Sensor to Monitor the Evaporation Process of Isopropyl Alcohol
Junhee PARK, Taekyun YOO, Jiseung LEE, ChanHeum PARK, Jaehyun KO, Moongyu JANG
New Phys.: Sae Mulli 2019; 69: 578-583  https://doi.org/10.3938/NPSM.69.578
Full Text(PDF)
Study on the Correlation of Microstructure with Deposition Temperature of Thin Silicon Films by Using Spectroscopic Ellipsometry and Hydrogen Effusion
Ka-Hyun KIM*
New Phys.: Sae Mulli 2019; 69: 584-589  https://doi.org/10.3938/NPSM.69.584
Full Text(PDF)
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