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eISSN 2289-0041

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Lee HT, Lee IH, Park* HR.  Dependences of the Optical and the Electrical Properties of 50 nm Thick Copper Films Deposited by Using an Electron Beam Evaporator on the Evaporator's Vacuum Conditions.  NPSM 2018;68:781-787.  https://doi.org/10.3938/NPSM.68.781
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