pISSN 0374-4914
eISSN 2289-0041

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Choi J, Kim &, Kim &, Park &, Lee &, Jo* &, Kim &D.  Characterization of MgZnO films depending on the deposition power of RF sputtering system.  NPSM 2019;69:369-375.  https://doi.org/10.3938/NPSM.69.369
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