pISSN 0374-4914
eISSN 2289-0041

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Bae MG, Lee IS, Lee JW.  Defect Detection in XLPE Material Using Terahertz Wave-based Non-destructive Testing.  New Phys.: Sae Mulli 2021;71:305-309.  https://doi.org/10.3938/NPSM.71.305