Fig. 2. (Color online) (a) X-ray photoelectron spectroscopy (XPS) and (b) high resolution X-ray diffraction (HR-XRD) measurements after cutting the cross section of the grown hexagonal Si single crystal.

New Phys.: Sae Mulli 2021;71:827~837 https://doi.org/10.3938/NPSM.71.827

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