Download original image
Fig. 2. (Color online) (a) X-ray photoelectron spectroscopy (XPS) and (b) high resolution X-ray diffraction (HR-XRD) measurements after cutting the cross section of the grown hexagonal Si single crystal.
New Phys.: Sae Mulli 2021;71:827~837 https://doi.org/10.3938/NPSM.71.827
© NPSM