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Fig. 3. (Color online) (a) Measured microwave magnetic field intensity per input microwave power (I/P) as a function of the aluminum thin film thickness of the optical indicator. (b) Measured electrical resistance according to the aluminum thin film thickness. The electrical resistance was measured using the two-point probe method with a distance of 2 mm between the probes. (c) Calculated microwave absorption according to aluminum thin film thickness.
New Phys.: Sae Mulli 2022;72:19~24