New Physics: Sae Mulli

Table. 1. Table 1

Relative atomic ratio of Bi and In from X-ray photoelectron survey spectra of Bi 4f and In 3d regions of Bi-doped In₂O₃ films deposited at various temperatures.

	Deposition temperature
	RT	100 °C	200 °C	300 °C
Bi (%)	2.5	2.6	2.6	2.7
In (%)	97.5	97.4	97.4	97.3

New Phys.: Sae Mulli 2022;72:734~741 https://doi.org/10.3938/NPSM.72.734