Fig. 1(Color online) Measurements using X-ray Diffractometer to confirm the crystallinity of the SrRuO₃ thin films. (a) the SrRuO₃ thin film deposited for 50 minutes without annealed, and (b) annealed of the SrRuO₃ thin film deposited for 50 minutes at 700 °C for 30 seconds. And inset of (a) shows the samples image taken by a camera, respectively.

New Phys.: Sae Mulli 2022;72:754~760 https://doi.org/10.3938/NPSM.72.754

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