Fig. 5. (Color online) 3-Dimensional Atomic Force Microscope height image of the SrRuO₃ thin films. The SrRuO₃ thin films were deposited during (a) 5 min, and (b) 50 min.

New Phys.: Sae Mulli 2022;72:754~760 https://doi.org/10.3938/NPSM.72.754

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