Fig. 1. (Color online) Laser microscope for scattering measurements. (a) Schematic diagram of the home-built laser microscope employing balanced detection with lock-in amplifiers. (b) A photograph of the developed laser microscope. The sample plane was placed at the midpoint between the objective (Obj.) and condenser (Cond.) lenses. The reference and sample signals were obtained from two Si photodetectors, namely, Det. B and Det. A, respectively. For the scanning scattering-intensity measurements, a motorized stage was used. The wavelength of the incident laser was 532 nm.
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