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Fig. 1. (Color online) (a) Transmission electron microscopy (TEM) image of SiOx/SiO2 after annealing at 1100 °C. The scale bar in the inset is 5 nm. (b) PL spectrum of SiQDs:SiO2.
New Phys.: Sae Mulli 2023;73:647~651 https://doi.org/10.3938/NPSM.73.647
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