Download original image
Fig. 1.
(Color online) (a) Transmission electron microscopy (TEM) image of SiO
x
/SiO
2
after annealing at 1100 °C. The scale bar in the inset is 5 nm. (b) PL spectrum of SiQDs:SiO
2
.
New Phys.: Sae Mulli 2023;73:647~651
https://doi.org/10.3938/NPSM.73.647
© NPSM
©
New Physics: Sae Mulli
. / Powered by
INFOrang Co., Ltd