Fig. 7. (Color online) Beam test with ALPIDE attached PCB material fragment. (a) Threshold map of the ALPIDE chip 12B-B5 after irradiation, (b) the ratio of the number of null pixels to the total number of pixels in each specified region as a function of the accumulated dose.

New Phys.: Sae Mulli 2023;73:693~702 https://doi.org/10.3938/NPSM.73.693

© NPSM