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Fig. 2. SEM images of (a) polycrystalline Ag thin films, (b–e) single-crystalline Ag(111) thin films with a thickness of 5 nm (b), 10 nm (c), 20 nm (d) and 40 nm (e). The first, second and third rows show images observed at 10,000×, 30,000×, and 50,000× magnifications, respectively. Insets in (b–e) of 3rd row are magnified images at 100 nm scale.
New Phys.: Sae Mulli 2023;73:801~809