Fig. 5. (Color online) Misorientation line maps of (a–e) single-crystalline Ag(111) thin films with thicknesses of 5 nm (a), 10 nm (b), 20 nm (c), 30 nm (d), and 40 nm (e), respectively. The second row shows respective enlarged misorientation line maps marked by yellow box in first row.
© NPSM
