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Fig. 6. (Color online) (a–b) Misorientation line maps of Ag thin films with thicknesses of 40 nm (a) and 5 nm (b), respectively. (b) Schematic diagram of merging process of two orientations (ORs) as Ag thin film increasingly grows thicker.
New Phys.: Sae Mulli 2023;73:801~809 https://doi.org/10.3938/NPSM.73.801
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