npsm logo

Table. 1.

Post-annealing temperature-dependent structural information from X-ray diffraction.


Post-annealing temperature (°C) Peak position 2θ (°) FWHM (°) Crystallinity (nm)
800 44.2283 ± 0.0004 0.1650 ± 0.0008 54.3296 ± 0.2742
900 44.2223 ± 0.0007 0.1507 ± 0.0015 59.4619 ± 0.6036
1000 44.2198 ± 0.0008 0.1355 ± 0.0021 66.1595 ± 1.0111
New Phys.: Sae Mulli 2024;74:135~142 https://doi.org/10.3938/NPSM.74.135
© NPSM