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Fig. 2. (Color online) Optical images and surface topology from atomic force microscope of the film surface in as-grown (a) and (e), after post-annealing at (b) and (f) 800, (c) and (g) 900, and (d) and (h) 1000 °C. (i) Average height and long-axis length of particles. (j) Room-temperature X-ray diffraction pattern of Co films annealed at various temperatures.
New Phys.: Sae Mulli 2024;74:135~142