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Fig. 1. (Color online) (a)–(e) AFM images of the (001) NiCo2O4 films grown on (001) MgAl2O4 substrates at various deposition temperatures from 320 C to 100 C. The size for each image was 5 μm × 5 μm. (f) Root-mean-square (RMS) roughness in AFM images versus deposition temperature.
New Phys.: Sae Mulli 2024;74:354~360