npsm 새물리 New Physics : Sae Mulli

pISSN 0374-4914 eISSN 2289-0041


Research Paper

New Phys.: Sae Mulli 2019; 69: 355-360

Published online April 30, 2019

Copyright © New Physics: Sae Mulli.

Angular Dependence of the Critical Current Density of Nb Thin Films of Different Thicknesses with InAs Nanorods as Flux Pinning Centers

Tae Jong HWANG1*,  Dong Ho KIM2

1School of General Education, Yeungnam University, Gyeongsan 38541, Korea

2Department of Physics, Yeungnam University, Gyeongsan 38541, Korea


Received: December 4, 2018; Revised: February 3, 2019; Accepted: February 11, 2019

This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License ( which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.


Magnetic flux pinning of Nb thin films using semiconductor InAs nanorods as pinning centers was studied. The InAs nanorods were grown in a vertical orientation by using metalorganic chemical vapor deposition and the Nb thin films were deposited by sputtering. The specimens used for the measurement were a reference Nb thin film with no nanorods and Nb-InAs thin films with different thicknesses and embedded nanorods. The magnetic flux pinning effect of the nanorods at the upper critical field and the critical current density proved to be higher than that of the reference Nb thin film when the magnetic field was applied along the length of the nanorods. The effective flux pinning energies of the two Nb-InAs specimens showed similar magnetic field dependences, but were different from those of the Nb thin films. The angular dependence of the critical current densities of the two Nb-InAs specimens showed similar peak shapes in the vicinity of the perpendicular magnetic field direction on the substrate, but showed differences in the widths and the detailed forms of the peaks. This angular dependency was explained as being due to a change in the effective length of the flux lines pinned inside the nanorod.

Keywords: Flux pinning, InAs nanorods, Critical current density

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