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A Local Structural Phase Transition of VO$_{2}$ Studied Using EXAFS
New Phys.: Sae Mulli 2019; 69: 787~793
Published online August 30, 2019;
© 2019 New Physics: Sae Mulli.

Sang-Wook HAN*, In-Hui HWANG

Department of Physics Education and Institute of Fusion Science, Jeonbuk National University, Jeonju 54896, Korea
Correspondence to:
Received March 12, 2019; Revised May 2, 2019; Accepted July 2, 2019.
cc This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License ( which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
The local structural properties around a vanadium atom from a VO$_{2}$ film were quantitatively determined using extended X-ray absorption fine structure (EXAFS) measurements at K edge of vanadium at different temperatures. A VO$_{2}$ film was synthesized using a DC sputtering deposition. In order to eliminate the model dependence in EXAFS data analysis, we applied the M1-, M2-, and R-phase models to all temperature data. EXAFS revealed that VO$_{2}$ was in the M2 phase over a wide temperature range from 40 to 100 $ ^{\circ}$C, although the M1 and the R phases were dominant at low and high temperatures, respectively. This result is somewhat in contrast to previous observations.
PACS numbers: 61.05.cj, 61.66.$-$f, 61.82.Ms, 64.60.$-$i
Keywords: Structure, EXAFS, VO$_{2}$, Metal-insulator transition

February 2020, 70 (2)
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