search for
Thickness-Dependent Phase Change and Morphological and Electric Characteristic of Devices with Pentacene
New Phys.: Sae Mulli 2019; 69: 1231~1234
Published online December 31, 2019;
© 2019 New Physics: Sae Mulli.

Duri KIM, Zhirayr BAGHDASARTAN, Kiejin LEE*

Department of Physics, Sogang University, Seoul 04107, Korea
Correspondence to:
Received September 26, 2019; Revised October 16, 2019; Accepted October 16, 2019.
cc This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License ( which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
In this study, pentacene thin films of various thicknesses were fabricated by using the thermal evaporation method, and the phase change, surface morphology and electrical characteristics of these films were analyzed. As the pentacene thin film became thicker, the orthorhombic phase, the thin-film phase, and the bulk phase appeared, in that order, in the measured X-ray diffraction patterns. Also, the roughness was found to change with the phase, as confirmed through atomic force microscopy (AFM). A pentacene-based diode was fabricated, and the threshold voltage and mobility were measured. When the orthorhombic phase was dominant, the diode’s threshold voltage and mobility were 3.14 V and 3.64 $\times{10}^{-7}$ cm$ ^{2}$/ V$\cdot$s, respectively, and when the thin-film phase was dominant, those results were 1.50 V and $5.08 \times {10}^{-5}$ cm$ ^{2}$/ V$\cdot$s. When the bulk phase began to appear, the threshold voltage and mobility of the diode were 2.80 V and $6.75 \times {10}^{-5}$ cm$ ^{2}$/V$\cdot$s. In this way, we were able to observe the dependenced of the electrical properties on the properties of the phase.
PACS numbers: 73.90.+f
Keywords: Pentacene, Thermal evaporation method, Morphology, Diode

January 2020, 70 (1)
  • Scopus
  • CrossMark