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LCD Glass Defect Inspection Using a Digital Holographic Microscope
New Phys.: Sae Mulli 2019; 69: 1299~1302
Published online December 31, 2019;
© 2019 New Physics: Sae Mulli.

Sanghoon SHIN1, Younghun YU2*

1Kanghae Precision System, Hwaseong 18487, Korea
2Department of Physics and Research Institute for Basic Sciences, Jeju National University, Jeju 63243, Korea
Correspondence to:
Received September 2, 2019; Revised October 30, 2019; Accepted November 4, 2019.
cc This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License ( which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
Quality control of glass for display is a crucial issue, and defects existing in glass can dramatically degrade the quality of display devices. In optical path system, these defects cause different degrees of scattering to the beam, destroy the uniformity of the light field and reduce the beam quality. Here, we present the use of a digital holographic microscope as a tool for inspecting two- and three-dimensional defects. Glass quality control is an important issue in the manufacture of displays, and display quality can be degraded significantly by the presence of defects. We have demonstrated that defects can be quickly inspected and characterized through use of a digital holographic microscope, and we verified the results by comparing the images obtained using the digital microscope to the those captured using a through comparison to images captured using a confocal microscope.
PACS numbers: 42.40.Kw, 42.40.$-$i, 07. 60. Pb
Keywords: Digital holography, Off-axis holography, Defect inspection

December 2019, 69 (12)
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