npsm 새물리 New Physics : Sae Mulli

pISSN 0374-4914 eISSN 2289-0041
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Article

Research Paper

New Physics: Sae Mulli 2003; 47: 59-65

Published online July 1, 2003

Copyright © New Physics: Sae Mulli.

Optical Properties of ZnSe Epilayers Using Spectroscopic Ellipsometer

Spectroscopic Ellipsometer를 이용한 ZnSe/GaAs(100) 박막의 광학적 특성

Dae-Jung KIM1, Young-Moon YU1, Kwang-Jae LEE1 and Yong Dae CHOI1,* Ji-Hyun MOON2, Seon-Hyang YOU2 and Byungsung O, Yang-June JUNG3

1Department of Optical & Electronic Physics Mokwon University, Daejon 305-764
2Department of Physics Chungnam University, Daejon 302-729
3Department of Physics, Mokpo National University, Muan 534-729

Correspondence to:ydchoi@mokwon.ac.kr

Abstract

We have studied the optical response of ZnSe in the 1.5-8.7 eV photon energy range at room temperature by spectroscopic ellipsometry. The measured dielectric funtion spectra reveal distinct structures at energies of $E_O$, $E_O$ + $\Delta_O$, $E{\prime}_O$ + $\Delta_O$, $E_1$, $E_1$ + $\Delta_1$, $E_2$ critical points (CPs). These data are analyzed on the basis of a simpled model of the interband transition. Thus, new critical points around 6.30 eV and 8.26 eV are found to be $E_2$ and $E{\prime}_O$ + $\Delta_O$, respectively

Keywords: Spectroscopic ellipsometer, Dielectric constant, ZnSe, HWE

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