npsm 새물리 New Physics : Sae Mulli

pISSN 0374-4914 eISSN 2289-0041


Research Paper

New Physics: Sae Mulli 2003; 47: 354-361

Published online November 1, 2003

Copyright © New Physics: Sae Mulli.

In situ Visible Surface Magneto-Optical Kerr Effect Studies of Exchange-Bias Formation in Coupled Ferromagnetic/Antiferrmagnetic Films

Young-Sang YU1, Ki-Suk LEE1 and Sang-Koog KIM1,* Kwang Youn KIM2, Seong-Ho JANG3, Jeong-Woon LEE4 and Sung-Chul SHIN4

1Nanospintronics Laboratory, School of Materials Science and Engineering, Research Institute of Advanced Materials and College of Engineering, Seoul National University, Seoul 151-744
2Nanodevice Research Center, Korea Institute of Science and Technology, Seoul 136-791
3School of Materials Science and Engineering, Seoul National University, Seoul 151-742
4Center for Nanospinics of Spintronic Materials and Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 305-701



We report on in situ visible surface magneto-optical Kerr effect studies of exchange bias formation for a typical top spin valve having a layered structure of Ta/NiFe/CoFe/Cu/CoFe/FeMn/Ta and an exchange-coupled NiFe/FeMn/Co trilayer film, while cooling with or without an applied magnetic field through a blocking temperature. The exchange bias and its unidirectional anisotropy could be set by saturating the magnetizations in the ferromagnetic layers by using external magnetic elds while cooling through the blocking temperature. In a NiFe/FeMn/Co film, oppositelyoriented exchange bias at both ferromagnetic/antiferromagnetic interfaces could be set by using the oppositely-oriented remanent magnetizations of the two ferromagnetic layers while cooling through a blocking temperature. These results show that exchange bias is determined by the magnetizations of the ferromagnetic layers in close proximity to an antiferromagnetic layer during the film growth or subsequent cooling through a blocking temperature.

Keywords: Exchange bias, Formation mechanism, Unidirectional anisotropy

Stats or Metrics

Share this article on :

Related articles in NPSM