npsm 새물리 New Physics : Sae Mulli

pISSN 0374-4914 eISSN 2289-0041
Qrcode

Article

Research Paper

New Physics: Sae Mulli 2015; 65: 592-601

Published online June 30, 2015 https://doi.org/10.3938/NPSM.65.592

Copyright © New Physics: Sae Mulli.

Study on the Characteristics of a Silicon Pixel Chip for the ALICE-ITS Upgrade Project

Jiyoung KIM, In-Kwon YOO*, Kyungeon CHOI

Department of Physics, Pusan National University, Busan 609-735, Korea

Correspondence to:yoo@pusan.ac.kr

Received: April 28, 2015; Revised: May 15, 2015; Accepted: May 15, 2015

This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/3.0/) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The ALICE (A Large Ion Collider Experiment) is a general purpose experiment dedicated to the study of heavy-ion collisions at the Large Hadron Collider (LHC). The main goal of the ALICE-ITS (Inner Tracking System) upgrade project is to improve the vertexing and the tracking capabilities at low $p_T$ according to projected increase in the luminosity at the LHC. The new ITS is, therefore, based on the latest silicon pixel technology and is designed to increase the data-taking rate with a new readout system and to reduce the pixel size and the material budget. We constructed a pixel chip test system at Pusan National University (PNU) to measure the characteristics of the pixel chips. We measured the characteristics of the prototype pixel chips for the new ITS by using PNU's system and analyzed the results for the characteristics of the pixel chips. We have been studying the optimized pixel chip geometry for the new ITS through the measurement results. This paper focuses on the ITS chip characterization test system built at Pusan National University and the measurement results.

Keywords: Silicon pixel detector, CMOS imaging sensor, Inner tracking system, ALICE upgrade, Pixel chip characterization

Stats or Metrics

Share this article on :

Related articles in NPSM