Quality control of glass for display is a crucial issue, and defects existing in glass can dramatically degrade the quality of display devices. In optical path system, these defects cause different degrees of scattering to the beam, destroy the uniformity of the light field and reduce the beam quality. Here, we present the use of a digital holographic microscope as a tool for inspecting two- and three-dimensional defects. Glass quality control is an important issue in the manufacture of displays, and display quality can be degraded significantly by the presence of defects. We have demonstrated that defects can be quickly inspected and characterized through use of a digital holographic microscope, and we verified the results by comparing the images obtained using the digital microscope to the those captured using a through comparison to images captured using a confocal microscope.

Keywords: Digital holography, Off-axis holography, Defect inspection